glib/tests/refcount/closures.c
Philip Withnall e0148985f3 Merge branch 'tests-tsan' into 'master'
tests: Fix some data races in tests

See merge request GNOME/glib!453
2018-11-13 13:12:38 +00:00

298 lines
8.4 KiB
C

/* Copyright (C) 2005 Imendio AB
*
* This software is provided "as is"; redistribution and modification
* is permitted, provided that the following disclaimer is retained.
*
* This software is distributed in the hope that it will be useful,
* but WITHOUT ANY WARRANTY; without even the implied warranty of
* MERCHANTABILITY or FITNESS FOR A PARTICULAR PURPOSE.
* In no event shall the authors or contributors be liable for any
* direct, indirect, incidental, special, exemplary, or consequential
* damages (including, but not limited to, procurement of substitute
* goods or services; loss of use, data, or profits; or business
* interruption) however caused and on any theory of liability, whether
* in contract, strict liability, or tort (including negligence or
* otherwise) arising in any way out of the use of this software, even
* if advised of the possibility of such damage.
*/
#include <glib-object.h>
#ifdef G_OS_UNIX
#include <unistd.h>
#endif
#define TEST_POINTER1 ((gpointer) 47)
#define TEST_POINTER2 ((gpointer) 49)
#define TEST_INT1 (-77)
#define TEST_INT2 (78)
/* --- GTest class --- */
typedef struct {
GObject object;
gint value;
gpointer test_pointer1;
gpointer test_pointer2;
} GTest;
typedef struct {
GObjectClass parent_class;
void (*test_signal1) (GTest * test, gint an_int);
void (*test_signal2) (GTest * test, gint an_int);
} GTestClass;
#define G_TYPE_TEST (my_test_get_type ())
#define MY_TEST(test) (G_TYPE_CHECK_INSTANCE_CAST ((test), G_TYPE_TEST, GTest))
#define MY_IS_TEST(test) (G_TYPE_CHECK_INSTANCE_TYPE ((test), G_TYPE_TEST))
#define MY_TEST_CLASS(tclass) (G_TYPE_CHECK_CLASS_CAST ((tclass), G_TYPE_TEST, GTestClass))
#define MY_IS_TEST_CLASS(tclass) (G_TYPE_CHECK_CLASS_TYPE ((tclass), G_TYPE_TEST))
#define MY_TEST_GET_CLASS(test) (G_TYPE_INSTANCE_GET_CLASS ((test), G_TYPE_TEST, GTestClass))
static GType my_test_get_type (void);
G_DEFINE_TYPE (GTest, my_test, G_TYPE_OBJECT)
/* --- variables --- */
static volatile gboolean stopping = FALSE;
static guint test_signal1 = 0;
static guint test_signal2 = 0;
static gboolean seen_signal_handler = FALSE;
static gboolean seen_cleanup = FALSE;
static gboolean seen_test_int1 = FALSE;
static gboolean seen_test_int2 = FALSE;
static gboolean seen_thread1 = FALSE;
static gboolean seen_thread2 = FALSE;
/* --- functions --- */
static void
my_test_init (GTest * test)
{
g_print ("init %p\n", test);
test->value = 0;
test->test_pointer1 = TEST_POINTER1;
test->test_pointer2 = TEST_POINTER2;
}
enum {
ARG_0,
ARG_TEST_PROP
};
static void
my_test_set_property (GObject *object,
guint prop_id,
const GValue *value,
GParamSpec *pspec)
{
GTest *test = MY_TEST (object);
switch (prop_id)
{
case ARG_TEST_PROP:
test->value = g_value_get_int (value);
break;
default:
G_OBJECT_WARN_INVALID_PROPERTY_ID (object, prop_id, pspec);
break;
}
}
static void
my_test_get_property (GObject *object,
guint prop_id,
GValue *value,
GParamSpec *pspec)
{
GTest *test = MY_TEST (object);
switch (prop_id)
{
case ARG_TEST_PROP:
g_value_set_int (value, test->value);
break;
default:
G_OBJECT_WARN_INVALID_PROPERTY_ID (object, prop_id, pspec);
break;
}
}
static void
my_test_test_signal2 (GTest *test,
gint an_int)
{
}
static void
my_test_emit_test_signal1 (GTest *test,
gint vint)
{
g_signal_emit (G_OBJECT (test), test_signal1, 0, vint);
}
static void
my_test_emit_test_signal2 (GTest *test,
gint vint)
{
g_signal_emit (G_OBJECT (test), test_signal2, 0, vint);
}
static void
my_test_class_init (GTestClass *klass)
{
GObjectClass *gobject_class = G_OBJECT_CLASS (klass);
gobject_class->set_property = my_test_set_property;
gobject_class->get_property = my_test_get_property;
test_signal1 = g_signal_new ("test-signal1", G_TYPE_FROM_CLASS (klass), G_SIGNAL_RUN_LAST,
G_STRUCT_OFFSET (GTestClass, test_signal1), NULL, NULL,
g_cclosure_marshal_VOID__INT, G_TYPE_NONE, 1, G_TYPE_INT);
test_signal2 = g_signal_new ("test-signal2", G_TYPE_FROM_CLASS (klass), G_SIGNAL_RUN_LAST,
G_STRUCT_OFFSET (GTestClass, test_signal2), NULL, NULL,
g_cclosure_marshal_VOID__INT, G_TYPE_NONE, 1, G_TYPE_INT);
g_object_class_install_property (G_OBJECT_CLASS (klass), ARG_TEST_PROP,
g_param_spec_int ("test-prop", "Test Prop", "Test property",
0, 1, 0, G_PARAM_READWRITE));
klass->test_signal2 = my_test_test_signal2;
}
static void
test_closure (GClosure *closure)
{
/* try to produce high contention in closure->ref_count */
guint i = 0, n = g_random_int () % 199;
for (i = 0; i < n; i++)
g_closure_ref (closure);
g_closure_sink (closure); /* NOP */
for (i = 0; i < n; i++)
g_closure_unref (closure);
}
static gpointer
thread1_main (gpointer data)
{
GClosure *closure = data;
while (!stopping)
{
static guint count = 0;
test_closure (closure);
if (++count % 10000 == 0)
{
g_printerr ("c");
g_thread_yield(); /* force context switch */
seen_thread1 = TRUE;
}
}
return NULL;
}
static gpointer
thread2_main (gpointer data)
{
GClosure *closure = data;
while (!stopping)
{
static guint count = 0;
test_closure (closure);
if (++count % 10000 == 0)
{
g_printerr ("C");
g_thread_yield(); /* force context switch */
seen_thread2 = TRUE;
}
}
return NULL;
}
static void
test_signal_handler (GTest *test,
gint vint,
gpointer data)
{
g_assert (data == TEST_POINTER2);
g_assert (test->test_pointer1 == TEST_POINTER1);
seen_signal_handler = TRUE;
seen_test_int1 |= vint == TEST_INT1;
seen_test_int2 |= vint == TEST_INT2;
}
static void
destroy_data (gpointer data,
GClosure *closure)
{
seen_cleanup = data == TEST_POINTER2;
g_assert (closure->ref_count == 0);
}
static void
test_emissions (GTest *test)
{
my_test_emit_test_signal1 (test, TEST_INT1);
my_test_emit_test_signal2 (test, TEST_INT2);
}
int
main (int argc,
char **argv)
{
GThread *thread1, *thread2;
GClosure *closure;
GTest *object;
guint i;
g_print ("START: %s\n", argv[0]);
g_log_set_always_fatal (G_LOG_LEVEL_WARNING | G_LOG_LEVEL_CRITICAL | g_log_set_always_fatal (G_LOG_FATAL_MASK));
object = g_object_new (G_TYPE_TEST, NULL);
closure = g_cclosure_new (G_CALLBACK (test_signal_handler), TEST_POINTER2, destroy_data);
g_signal_connect_closure (object, "test-signal1", closure, FALSE);
g_signal_connect_closure (object, "test-signal2", closure, FALSE);
stopping = FALSE;
thread1 = g_thread_create (thread1_main, closure, TRUE, NULL);
thread2 = g_thread_create (thread2_main, closure, TRUE, NULL);
/* The 16-bit compare-and-swap operations currently used for closure
* refcounts are really slow on some ARM CPUs, notably Cortex-A57.
* Reduce the number of iterations so that the test completes in a
* finite time, but don't reduce it so much that the main thread
* starves the other threads and causes a test failure.
*
* https://gitlab.gnome.org/GNOME/glib/issues/1316
* aka https://bugs.debian.org/880883 */
#if defined(__aarch64__) || defined(__arm__)
for (i = 0; i < 100000; i++)
#else
for (i = 0; i < 1000000; i++)
#endif
{
static guint count = 0;
test_emissions (object);
if (++count % 10000 == 0)
{
g_printerr (".\n");
g_thread_yield(); /* force context switch */
}
}
stopping = TRUE;
g_print ("\nstopping\n");
/* wait for thread shutdown */
g_thread_join (thread1);
g_thread_join (thread2);
/* finalize object, destroy signals, run cleanup code */
g_object_unref (object);
g_print ("stopped\n");
g_assert (seen_thread1 != FALSE);
g_assert (seen_thread2 != FALSE);
g_assert (seen_test_int1 != FALSE);
g_assert (seen_test_int2 != FALSE);
g_assert (seen_signal_handler != FALSE);
g_assert (seen_cleanup != FALSE);
return 0;
}